We are innovation leader in high precision measurement instruments and ATE system solutions for power semiconductor devices.Our products cover all test of Sic,GaN,and Si power semiconductor devices, providing accurate,reliable,and cost-effective test system solutions for IDM enterprises. NEV manufacturers,Tierls, and power device design and packaging enterprises.

Our test systems include dynamic wafer-level reliability test system, known good die test system, surge current test system, dynamic characteristics test system,static characteristics test system,dynamic reliability test system,automotive-grade continuous power test system, etc. We cover power semiconductor test from wafer level test(chip probing), chip level test(known good die), discrete/module level test (final test), and system level test, which can meet various scenario requirements in laboratories and production lines.